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§700-8530@‰ªŽRŒ§‰ªŽRŽs–k‹æ’Ó‡’†3-‚P-‚P
TelF086-251-7897, FaxF086-251-7903

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§739-0046@L“‡Œ§“ŒL“‡Žs‹¾ŽR2-313
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TelF082-424-6297 ext:317

e-mail: wakita [at] cc.okayama-u.ac.jp

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2001-2002 “Œ‹ž‘åŠw•¨«Œ¤‹†Š COEŒ¤‹†ˆõ
2002-2005 à’c–@l ‚‹P“xŒõ‰ÈŠwŒ¤‹†ƒZƒ“ƒ^[ ‹¦—ÍŒ¤‹†ˆõ
2005-2010 ‰ªŽR‘åŠwŠE–ʉȊwŒ¤‹†Ž{Ý ”ñí‹ÎŒ¤‹†ˆõ
2010-2012 ‰ªŽR‘åŠwŽ©‘R‰ÈŠwŒ¤‹†‰È “Á”C•‹³
2012- Œ»E

Selected Publications

[1] Hard X-ray Photoelectron Emission Microscopy as a Tool to Study Buried Interfaces
T. Wakita, T. Taniuchi, K. Ono, M. Suzuki, N. Kawamura, M. Takagaki, H. Miyagawa,
F. Z. Guo, T. Nakamura, T. Muro, H. Akinaga, T. Yokoya, M. Oshima and K. Kobayashi,
Japanese Journal of Applied Physics 45 (2006) 1886-1888.

[2] Local electronic structure analysis using a photoelectron emission microscope (PEEM) with hard x-ray
M. Kotsugi, T. Wakita, T. Taniuchi, K. Ono, M. Suzuki, N. Kawamura,
M. Takagaki, M. Taniguchi, K. Kobayashi, M. Oshima, N. Ishimatsu and H. Maruyama,
e-Journal of Surface Science and Nanotechnology 4 (2006) 490-493.

[3] Introduction of photoemission electron microscopes at SPring-8 for nanotechnology support
F.Z. Guo, T. Wakita, H. Shimizu,T. Matsushita, T. Yasue, T. Koshikawa, E. Bauer and K. Kobayashi,
Journal of Physics: Condensed Matter 17 (2005) S1363-S1370.

[4] HREELS Study of C70 Moleules Adsorbed on a Si(111)7x7 Surface
T. Wakita, K. Sakamoto and S. Suto,
Applied Surface Science 169-170 (2001) 146-51.

[5] Adsorption and Thermal Reacton of C70 on Si(111)-(7x7) and Si (001)-(2x1) Surfaces: Comparison with C60
T. Wakita, K. Sakamoto, A. Kasuya, N. Nishina and S. Suto,
Applied Surface Science 144-145 (1999) 653-656.